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International Symposium on Design and Diagnostics of Electronic Circuits and Systems
| Title: | International Symposium on Design and Diagnostics of Electronic Circuits and Systems | Authors: | Stamenkovic, Zoran; Bosio, Alberto; Cserey, Gyorgy; Novak, Ondrej; Pleskacz, Witold; Sekanina, Lukas; Steininger, Andreas; Stojanovic, Goran M   ; Stopjakova, Viera |
Issue Date: | 2019 | Publication: | 2019 IEEE INTERNATIONAL TEST CONFERENCE (ITC) | ISSN: | 1089-3539  Search Idenfier |
Publisher: | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Type: | Conference Paper | WoS-ID: | 000540385000026 | URI: | https://enauka.gov.rs/handle/123456789/830705 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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